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Part Number | SN74BCT8373ADWRE4 |
Description | IC SCAN TEST DEVICE LATCH 24SOIC |
Manufacturer | Texas Instruments |
Series | 74BCT |
Part Status | Obsolete |
Logic Type | Scan Test Device with D-Type Latches |
Supply Voltage | 4.5V ~ 5.5V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |