Product Introduction
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Product Specifications
| Part Number |
SN74BCT8374ANTG4 |
| Description |
IC SCAN TEST DEVICE W/FF 24-DIP |
| Manufacturer |
Texas Instruments |
| Series |
74BCT |
| Part Status |
Obsolete |
| Logic Type |
Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage |
4.5V ~ 5.5V |
| Number of Bits |
8 |
| Operating Temperature |
0°C ~ 70°C |
| Mounting Type |
Through Hole |
| Package / Case |
24-DIP (0.300", 7.62mm) |
| Supplier Device Package |
24-PDIP |
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