Product Introduction
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Product Specifications
| Part Number |
SN74BCT8374ADW |
| Description |
IC SCAN TEST DEVICE W/FF 24-SOIC |
| Manufacturer |
Texas Instruments |
| Series |
74BCT |
| Part Status |
Active |
| Logic Type |
Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage |
4.5V ~ 5.5V |
| Number of Bits |
8 |
| Operating Temperature |
0°C ~ 70°C |
| Mounting Type |
Surface Mount |
| Package / Case |
24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package |
24-SOIC |
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