Product Introduction
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Product Specifications
Part Number |
SN74ABTH18646APM |
Description |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Manufacturer |
Texas Instruments |
Series |
74ABTH |
Part Status |
Active |
Logic Type |
Scan Test Device With Transceivers And Registers |
Supply Voltage |
4.5V ~ 5.5V |
Number of Bits |
18 |
Operating Temperature |
-40°C ~ 85°C |
Mounting Type |
Surface Mount |
Package / Case |
64-LQFP |
Supplier Device Package |
64-LQFP (10x10) |
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