Product Introduction
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Product Specifications
Part Number |
SN74BCT8374ADWRE4 |
Description |
IC SCAN TEST DEVICE W/FF 24-SOIC |
Manufacturer |
Texas Instruments |
Series |
74BCT |
Part Status |
Obsolete |
Logic Type |
Scan Test Device with D-Type Edge-Triggered Flip-Flops |
Supply Voltage |
4.5V ~ 5.5V |
Number of Bits |
8 |
Operating Temperature |
0°C ~ 70°C |
Mounting Type |
Surface Mount |
Package / Case |
24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package |
24-SOIC |
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