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Part Number | SN74LVTH18646APM |
Description | IC SCAN-TEST-DEV/XCVR 64-LQFP |
Manufacturer | Texas Instruments |
Series | 74LVTH |
Part Status | Active |
Logic Type | ABT Scan Test Device With Transceivers and Registers |
Supply Voltage | 2.7V ~ 3.6V |
Number of Bits | 18 |
Operating Temperature | -40°C ~ 85°C |
Mounting Type | Surface Mount |
Package / Case | 64-LQFP |
Supplier Device Package | 64-LQFP (10x10) |