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Part Number | SN74ABT8245DW |
Description | IC SCAN TEST DEV/TXRX 24-SOIC |
Manufacturer | Texas Instruments |
Series | 74ABT |
Part Status | Active |
Logic Type | Scan Test Device with Bus Transceivers |
Supply Voltage | 4.5V ~ 5.5V |
Number of Bits | 8 |
Operating Temperature | -40°C ~ 85°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |