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Logic - Specialty Logic
| Image | Part Number | Description | Manufacturer | Quick Order |
|---|---|---|---|---|
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MC10EP116FA | IC RCVR/DRVR HEX 6BIT DFF 32LQFP | ON Semiconductor | |
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MC10EP116FAG | IC RCVR/DRVR HEX 6BIT DFF 32LQFP | ON Semiconductor | |
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MC10EP116FAR2 | IC RCVR/DRVR HEX 6BIT DFF 32LQFP | ON Semiconductor | |
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MC10EP116FAR2G | IC RCVR/DRVR HEX 6BIT DFF 32LQFP | ON Semiconductor | |
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SN74ABT8646DL | IC SCAN-TEST-DEV/XCVR 28-SSOP | Texas Instruments | |
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SN74ABT8652DL | IC SCAN-TEST-DEV/XCVR 28-SSOP | Texas Instruments | |
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SN74ABT8543DL | IC SCAN TEST DEV/TXRX 28-SSOP | Texas Instruments | |
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SN74ABT8646DLG4 | IC SCAN TEST DEVICE 28-SSOP | Texas Instruments | |
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SN74ABT8652DLG4 | IC SCAN TEST DEVICE 28-SSOP | Texas Instruments | |
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74ABT899CMSA | TXRX W/GENERATORCHECKER 28SSOP | ON Semiconductor | |
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74ABT899CMSAX | TXRX W/GENERATORCHECKER 28SSOP | ON Semiconductor | |
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74ABT899CSC | TXRX W/GENERATORCHECKER 28SOIC | ON Semiconductor | |
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74ABT899CSCX | TXRX W/GENERATORCHECKER 28SOIC | ON Semiconductor | |
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74ABT899D,112 | IC 9BIT DUAL LATCH TXRX 28SOIC | NXP USA Inc. | |
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74ABT899D,118 | IC 9BIT DUAL LATCH TXRX 28SOIC | NXP USA Inc. | |
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74ABT899DB,112 | IC 9BIT DUAL LATCH TXRX 28SSOP | NXP USA Inc. | |
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74ABT899DB,118 | IC 9BIT DUAL LATCH TXRX 28SSOP | NXP USA Inc. | |
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SN74ABT8543DLR | IC SCAN TEST DEVICE 28-SSOP | Texas Instruments | |
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SN74ABT8646DLR | IC SCAN TEST DEVICE 28-SSOP | Texas Instruments | |
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SN74ABT8652DLR | IC SCAN TEST DEVICE 28-SSOP | Texas Instruments | |
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SN74ABT8652DLRG4 | IC SCAN TEST DEVICE 28-SSOP | Texas Instruments | |
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SN74ABT8952DL | IC SCAN-TEST-DEV/XCVR 28-SSOP | Texas Instruments | |
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SN74ABT8952DLR | IC SCAN TESST DEVICE 28-SSOP | Texas Instruments | |
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SN74ABT8952DLRG4 | IC SCAN TESST DEVICE 28-SSOP | Texas Instruments | |
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SN74ABT8245DW | IC SCAN TEST DEV/TXRX 24-SOIC | Texas Instruments | |
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SN74BCT8244ADW | IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | |
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SN74LVT8980ADWR | IC TEST-BUS CONTROLLER 24-SOIC | Texas Instruments | |
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SN74LVT8980ADWRG4 | IC TEST-BUS CONTROLLER 24-SOIC | Texas Instruments | |
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SN74ABT8245DWG4 | IC SCAN TEST DEVICE 24SOIC | Texas Instruments | |
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SN74LVT8996DW | IC 10-BIT SCAN PORT XCVR 24-SOIC | Texas Instruments | |
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SN74ABT8996DW | IC ADDRESSABLE SCAN PORT 24-SOIC | Texas Instruments | |
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SN74LVT8980ADW | IC TEST-BUS CONTROLLER 24-SOIC | Texas Instruments | |
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SN74ABT8245DWR | IC SCAN TEST DEV W/OBT 24-SOIC | Texas Instruments | |
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SN74LVT8980AIDWREP | IC EMBEDDED TEST BUS CTRL 24SOIC | Texas Instruments | |
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SN74TVC3010DWR | IC 10BIT VOLTAGE CLAMP 24-SOIC | Texas Instruments | |
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SN74BCT8245ADW | IC SCAN TEST DEVICE TXRX 24-SOIC | Texas Instruments | |
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SN74BCT8373ADW | IC SCAN TEST DEVICE LATCH 24SOIC | Texas Instruments | |
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SN74BCT8240ADW | IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | |
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SN74BCT29854DW | IC TRANSCEIVER 1-9BIT 24SOIC | Texas Instruments | |
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SN74BCT8245ADWR | IC SCAN TEST DEVICE TXRX 24-SOIC | Texas Instruments | |
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SN74TVC3010DW | IC 10BIT VOLTAGE CLAMP 24-SOIC | Texas Instruments | |
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SN74LVT8996DWR | IC 10-BIT SCAN PORT XCVR 24-SOIC | Texas Instruments | |
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SN74BCT8374ADW | IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | |
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SN74BCT8244ADWE4 | IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | |
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N74F656AD,602 | IC BUFFER/LDRIVER OCTAL 24SOIC | NXP USA Inc. | |
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N74F656AD,623 | IC BUFFER/DRIVER OCTAL 24SOIC | NXP USA Inc. | |
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SN74ABT8996DWR | IC ADDRESSABLE SCAN PORT 24-SOIC | Texas Instruments | |
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SN74AS181ADW | IC ARITHMETIC LOGIC UNIT 24-SOIC | Texas Instruments | |
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SN74AS181ADWE4 | IC ARITHMETIC LOGIC UNIT 24-SOIC | Texas Instruments | |
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SN74AS181ADWG4 | IC ARITHMETIC LOGIC UNIT 24SOIC | Texas Instruments |