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Tantalum - Polymer Capacitors
| Image | Part Number | Description | Manufacturer | Quick Order |
|---|---|---|---|---|
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SN74AS181ADWR | IC ARITHMETIC LOGIC UNIT 24-SOIC | Texas Instruments | |
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SN74AS181ADWRE4 | IC ARITHMETIC LOGIC UNIT 24-SOIC | Texas Instruments | |
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SN74AS181ADWRG4 | IC ARITHMETIC LOGIC UNIT 24SOIC | Texas Instruments | |
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SN74BCT29854DWR | IC TRANSCEIVER 1-9BIT 24SOIC | Texas Instruments | |
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SN74BCT29854DWRE4 | IC TRANSCEIVER 1-9BIT 24SOIC | Texas Instruments | |
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SN74BCT29854DWRG4 | IC TRANSCEIVER 1-9BIT 24SOIC | Texas Instruments | |
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SN74BCT8240ADWR | IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | |
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SN74BCT8240ADWRE4 | IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | |
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SN74BCT8240ADWRG4 | IC SCAN TEST DEVICE 24SOIC | Texas Instruments | |
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SN74BCT8244ADWR | IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | |
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SN74BCT8373ADWR | IC SCAN TEST DEVICE LATCH 24SOIC | Texas Instruments | |
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SN74BCT8373ADWRE4 | IC SCAN TEST DEVICE LATCH 24SOIC | Texas Instruments | |
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SN74BCT8373ADWRG4 | IC SCAN TEST DEVICE 24SOIC | Texas Instruments | |
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SN74BCT8374ADWR | IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | |
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SN74BCT8374ADWRE4 | IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | |
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SN74BCT8374ADWRG4 | IC SCAN TEST DEVICE 24SOIC | Texas Instruments | |
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74F181SPC | IC ARITHMETIC LOGIC 4BIT 24-DIP | ON Semiconductor | |
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MC10H330P | IC DRIVER/RCVR QUAD BUS 24-DIP | ON Semiconductor | |
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MC10H330PG | IC DRIVER/RCVR QUAD BUS 24-DIP | ON Semiconductor | |
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N74F656AN,602 | IC BUFFER/LDRIVER OCTAL 24-DIP | NXP USA Inc. | |
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SN74AS181ANT | IC ARITHMETIC LOGIC UNIT 24DIP | Texas Instruments | |
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SN74AS181ANTG4 | IC ARITHMETIC LOGIC UNIT 24DIP | Texas Instruments | |
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SN74BCT29854NT | IC TRANSCEIVER 1-9BIT 24DIP | Texas Instruments | |
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SN74BCT8240ANT | IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | |
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SN74BCT8240ANTG4 | IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | |
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SN74BCT8244ANT | IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | |
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SN74BCT8244ANTG4 | IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | |
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SN74BCT8245ANT | IC SCAN TEST DEVICE TXRX 24-DIP | Texas Instruments | |
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SN74BCT8245ANTG4 | IC SCAN TEST DEVICE TXRX 24-DIP | Texas Instruments | |
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SN74BCT8373ANT | IC SCAN TEST DEVICE LATCH 24-DIP | Texas Instruments | |
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SN74BCT8374ANT | IC SCAN TEST DEVICE W/FF 24-DIP | Texas Instruments | |
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SN74BCT8374ANTG4 | IC SCAN TEST DEVICE W/FF 24-DIP | Texas Instruments | |
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MC10EP17DTG | IC RCVR/DRVR QUAD ECL DF 20TSSOP | ON Semiconductor | |
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MC100EP17DTG | IC RCVR/DRV ECL QUAD DFF 20TSSOP | ON Semiconductor | |
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NB100LVEP17DTR2G | IC DRV/RCV ECL QUAD DIFF 20TSSOP | ON Semiconductor | |
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74ACT1284TTR | IC TXRX IEEE 1284 HS 20-TSSOP | STMicroelectronics | |
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MC100EP17DT | IC RCVR/DRV ECL QUAD DFF 20TSSOP | ON Semiconductor | |
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MC100EP17DTR2 | IC RCVR/DRV ECL QUAD DFF 20TSSOP | ON Semiconductor | |
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MC100EP17DTR2G | IC RCVR/DRV ECL QUAD DFF 20TSSOP | ON Semiconductor | |
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MC10EP17DT | IC RCVR/DRVR QUAD ECL DF 20TSSOP | ON Semiconductor | |
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MC10EP17DTR2 | IC RCVR/DRVR QUAD ECL DF 20TSSOP | ON Semiconductor | |
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MC10EP17DTR2G | IC RCVR/DRVR QUAD DIFF 20-TSSOP | ON Semiconductor | |
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NB100LVEP17DT | IC DRV/RCV ECL QUAD DIFF 20TSSOP | ON Semiconductor | |
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NB100LVEP17DTG | IC DRV/RCV ECL QUAD DIFF 20TSSOP | ON Semiconductor | |
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NB100LVEP17DTR2 | IC DRV/RCV ECL QUAD DIFF 20TSSOP | ON Semiconductor | |
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74ACT1284MSA | IC TRANSCEIVER IEEE1284 20-SSOP | ON Semiconductor | |
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74ACT1284MSAX | TXRX IEEE TTL COMPATIBLE 20SSOP | ON Semiconductor | |
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SY100EL17VZG | IC RECEIVER QUAD DIFF 20-SOIC | Microchip Technology | |
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MC100LVEL17DWG | IC RCVR DFF QUAD ECL 3.3V 20SOIC | ON Semiconductor | |
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MC100LVEL17DWR2G | IC RCVR DFF QUAD ECL 3.3V 20SOIC | ON Semiconductor |